Saturday, March 27, 2010

IEEE EDS Colloquium to take place on March 25 & 26

The IEEE Electron Device Society (EDS) Orlando Chapter, the IEEE UCF Student Branch and School of Electrical Engineering and Computer Science would like to welcome you to the IEEE EDS Mini-Colloquium to take place on March 25th and 26th at University of Central Florida, ENG 3 (HEC) building, room 101.The technical program consists of nine talks given by
internationally recognized lecturers in the field of electron devices. The topics
include electron device physics and modeling, electrostatic discharge protection
design, testing and circuit simulation, high-k gate, reliability, and fabrication for advanced technologies.

This colloquium will provide an excellent opportunity for UCF graduate and undergraduate students to learn about the state of the art in micro/nanoelectronics, to interact and exchange ideas with the speakers, and to discuss research activities. Furthermore, it provides a great networking opportunity for all the IEEE members in the Central Florida region. Refreshments
will be provided. For detailed information visit:

The schedule is listed below:

March 25th
8:30- 8:50 AM Dr. Issa
Batarseh (UCF) Director's Message

- 9:00 Dr. Juin J. Liou (UCF) Opening Speech

- 9:15 Slavica Malobabic (UCF, EDS) Welcome Note

- 10:15 Dr. Tom Sah & Dr. Binbin Jie (CTSAH Associates) Bipolar MOS Field-Effect Transistor Characteristics Operation in Unipolar Current Mode

- 11:15 Dr. Jean-Jacques Hajjar(Analog Devices) Challenges of CDM ESD Events Simulations

3:00 PM Dr. Vladislav Vashchenko (National Semiconductor) ESD for Analog IC

- 4:00 Dr. Tim Maloney (Intel)Charged Device Model ESD from Factory to Testing

- 5:00 Dr. Weng Hong Teh (Intel) To 3D or Not To 3D

March 26th

8:30 - 9:30 AM Dr. Fernando Guarin (IBM) Microelectronic Reliability Topics for Advanced CMOS and SiGe Technologies

9:30 - 10:30 Dr. Steven Voldman (Intersil) ESD Protection on System

10:30 - 11:30 Dr. Adelmo Ortiz-Conde (Simon Bolivar University) Recent Applications of the
Lambert Function in Device Modeling

11:30 - 12:30PM Dr. Hemanth Jagannathan (IBM) High-k/Metal Gate Technology or Si CMOS Applications - From Inception to Realization

We hope to see you all there!

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