Seminar: "Volatiles sampling and detection using
SPME-GC-MS and PSPME-IMS" by Anna Raeva
Friday, January 24, 2014 2:00 PM to 3:00 PM
CREOL Room 102
CREOL Room 102
Anna Raeva
Florida International University
Abstract:
Solid phase microextraction (SPME) is a widely used
technique for headspace sampling of volatiles. Its advantages include fast
extraction times and high sensitivity. It can be easily coupled to a
commercially available gas chromatograph – mass spectrometer (GC-MS). In this
presentation, the application of SPME-GC-MS to sampling and detection of
volatile compounds from the headspace of explosives and honey will be
described. In addition to SPME-GC-MS, planar solid phase microextraction
(PSPME) coupled to an ion mobility spectrometer (IMS) and its application to
non-contact sampling and extraction of volatiles from explosives will be
covered. PSPME is a sampling method that has been previously developed in our
research group. Compared to SPME, PSPME offers an increased surface area and
phase volume as well as the possibility of dynamic sampling. The performance of
PSPME coupled to a bench-top IMS and portable IMS as well as SPME coupled to a
bench-top GC-MS for sampling and detection of volatiles from explosives will be
compared. Smokeless powders will be used as a model system of explosives.
Biography:
Anna Raeva graduated with a BS and MS in Analytical
Chemistry from Moscow State University. She graduated with a PhD in Analytical
and Physical Chemsitry at the University of North Dakota in 2011, working on
trace element partitioning during coal combustion using a new in situ/direct
method, under the direction of Dr. Evguenii Kozliak and Dr. David Pierce. Since
2012, she has been a postdoctoral fellow in Dr. Jose Almirall's research group
at Florida International University. During her appointment she worked on
multiple projects: explosives detection using PSPME-IMS, manuka honey analysis
using SPME-GC-MS and analysis and discrimination of printing inks using
DART-MS, MALDI-MS, Py-GC-MS and FTIR. She is a member of ACS and ASMS.
For additional information:
Dr. Matthieu Baudelet
Research Assistant Professor of Optics
407-823-6910
baudelet @ creol . ucf . edu
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