Seminar: “Roughness, Scatter and Functional Properties of Optical Surfaces and Thin Films” - Angela Duparré CREOL 102 Monday, January 31, 2011 / 12:00pm-1:00pm
Angela Duparré
Fraunhofer Institute for Applied Optics and Precision Engineering Albert-Einstein-Strasse Jena, Germany angela.duparre@iof.fraunhofer.de
Abstract:
There is in an urgent need for characterization and analysis techniques which allow a sensitive and comprehensive, but also fast and easy inspection of the roughness and connected properties of optical surfaces and thin film coatings. The talk will give an introduction into our approach to meet these requirements by combining various characterization and modeling methods. In particular, light scattering techniques developed at the Fraunhofer IOF will be presented. Examples of investigations are discussed for high precision optical surfaces, low-scatter multilayer coatings as well as ultrahydrophobic components.
Biography:
Angela Duparré received her PhD degree (thesis on optical properties of high power laser mirrors) from the Physics Faculty of the Friedrich Schiller University of Jena in 1985. In 1992, she joined the Fraunhofer Institute for Applied Optics and Precision Engineering in Jena to become head of the Surface and Thin Film Characterization Group. Her interests have since been directed to the study of optical and non-optical surface and thin film properties such as light scattering, nano/microstructures and roughness as well as to the development of light scattering measurement and modelling techniques. She has published more than 100 papers, is involved in standardization committees and in the organization of conferences on optical metrology, fabrication, and thin film coatings.
For More Information:
Dr. James E. Harvey
407-823-6818
No comments:
Post a Comment